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Scanning Imager - List of Manufacturers, Suppliers, Companies and Products

Scanning Imager Product List

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[Special Feature] "Appearance Inspection System" Aiming for Zero Defects

[Special Feature] "Appearance Inspection System" Aiming for Zero Defects

By enlarging the defect area, small defects become visible! Here is an overview of the inspection device.

This document provides an overview of the ultra-wide field laser scanning imager defect inspection device. It includes sections on "Defect Inspection Devices and Laser Scanning Technology," "Development Background and Unique Technology Features," and "Development Case Studies." We encourage you to read it. 【Contents】 1. Defect Inspection Devices and Laser Scanning Technology 2. Development Background and Unique Technology Features 3. Development Case Studies 4. Trends in the Visual Inspection Market and Our Company's Response 5. Examples of Currently Used Laser Scanning Imagers 6. Applications and User Benefits *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope

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Ultra-wide field laser scanning imager 'LSM-4000 series'

Ultra-wide field laser scanning imager 'LSM-4000 series'

Detect defects at the 0.2μm level with a scanning width of 4mm! Introducing the standard laser scanning imager.

The "LSM-4000 Series" is a third type of observation device that is neither a microscope nor a CCD camera. It can capture wide and long images, making it suitable for detailed defect inspection. It is capable of detecting microcracks in ceramics and foreign objects. In addition to this series, we also offer the large laser scanning imager "LSM-6000 Series" and the compact laser scanning imager "LSM-3000 Series." 【Features of the LSM-4000 Series】 ■ Standard laser scanning imager ■ Detection of scratches and foreign objects of a few micrometers on transparent films, sapphire, glass, ceramics, etc. (dual screen display) ■ Detection of repair areas on super barrier films and ITO films ■ Capable of detecting microcracks in ceramics and foreign objects ■ Detects defects at the 0.2μm level with a scanning width of 4mm ■ Scanning lens is interchangeable *For more details, please refer to the PDF document or feel free to contact us.

  • Microscope

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FPD various components, optical defect inspection equipment, unparalleled wide field of view.

FPD various components, optical defect inspection equipment, unparalleled wide field of view.

FPD various components, optical defect inspection equipment, unparalleled wide field of view, 5 times faster and higher resolution compared to conventional methods, ultra-wide field confocal type, high resolution of 1μm.

Ultra-wide field confocal type, high-resolution 1μm micro-defect inspection laser scanning imager. Conventional microscope optical systems and SEMs can observe narrow areas at high resolution but cannot easily observe wide areas. This challenge is addressed by the laser scanning imager. It can measure 3D shapes within a range of 50×50 mm. Measurement time: 1μm resolution approximately 35 seconds, 5μm resolution approximately 10 seconds. ● Measurement width: 0.8μm, depth: 5nm. ● Shape measurement is possible at a maximum tilt of 45 degrees. ● Can also detect defects such as scratches and deep holes. Features of the laser scanning imager: - A new observation device that overcomes the shortcomings of conventional microscopes, CCD cameras, and line sensors (no illumination device required). - Newly developed dedicated scanning lens with a wide observation area (over 100 times that of a microscope) and long working distance. - High-contrast laser confocal optical unit. - The first raster scanning method in laser confocal microscope optics (capable of acquiring large area images with long and large images, equipped with multi-scan functionality). - Outline specifications: High scanning resolution (up to 20,000 points per scan), scanning speed 4000 lines/second. The laser uses LD405nm (also available in 650 and 830nm). - This is the first device that allows enlarged images to be viewed on a computer monitor.

  • Defect Inspection Equipment

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